SOUZA, E. P.; FACHI, L. R.; SANTOS, P. R. J.; SAVELLI, R. A.; NIED, A. H. Yield and validation of the scanner for use in the estimation of number of sunflower grains. Scientific Electronic Archives, [S. l.], v. 11, n. 6, p. 37–43, 2018. DOI: 10.36560/1162018602. Disponível em: https://sea.ufr.edu.br/SEA/article/view/602. Acesso em: 20 abr. 2024.